Semiconductor device fabrication

Results: 2185



#Item
121Thin film deposition / Semiconductor device fabrication / Vacuum / Coatings / Plasma processing / Atomic layer deposition / Vacuum deposition / Thin film / Chemical vapor deposition / CVD / Titanium nitride

FACULTY: FIELD OF STUDY: COURSE TITLE: LECTURER’S NAME: E-MAIL ADDRESS OF THE LECTURER: ECTS POINTS FOR THE COURSE:

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Source URL: wtie.tu.koszalin.pl

Language: English - Date: 2016-04-19 04:27:26
122Microtechnology / Semiconductor device fabrication / Silicon on insulator / Surgical suture / Microfabrication / Thermographic camera / Polydimethylsiloxane / Photoresist / Etching / Gallium nitride / Wafer / Photolithography

Flexible Electronics Thin, Flexible Sensors and Actuators as ‘Instrumented’ Surgical Sutures for Targeted Wound Monitoring and Therapy Dae-Hyeong Kim, Shuodao Wang, Hohyun Keum, Roozbeh Ghaffari,

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Source URL: rogers.matse.illinois.edu

Language: English - Date: 2012-11-19 13:01:24
123Semiconductor device fabrication / Etching / Microtechnology / Semiconductors / Reactive-ion etching / Chemical milling / Plasma / Crystal oscillator / Lam Research / Gas / Isotropic etching

WALL STATE EFFECTS ON Cl2 POLY-SI RIE: REAL-TIME MEASUREMENTS, MECHANISMS, AND FEEDBACK CONTROL SOLUTIONS Pete I. Klimecky, Jessy W. Grizzle, and Fred L. Terry, Jr. University of Michigan/EECS Dept. , RmBeal A

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Source URL: web.eecs.umich.edu

Language: English - Date: 2016-04-25 13:15:14
124Electronic engineering / Electronics manufacturing / Semiconductor device fabrication / Microtechnology / Nanotechnology / Potential applications of graphene / Polydimethylsiloxane / Stretchable electronics / Microfabrication / Flexible electronics / Resist

Sensors 2015, 15, ; doi:s150923459 OPEN ACCESS sensors ISSNwww.mdpi.com/journal/sensors

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Source URL: coleman.ucsd.edu

Language: English
125Microtechnology / Semiconductor device fabrication / Etching / Process engineering / Deep reactive-ion etching / Visualization / Chemical milling / Business process management / Process / Thermodynamic process / Business process modeling / Microfabrication

PDF Document

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Source URL: www.europractice.stfc.ac.uk

Language: English - Date: 2011-04-22 07:39:08
126Semiconductor device fabrication / Corrosion prevention / Passivation / Silicon carbide / Layer / Gallium / Light-emitting diode

Journal of Undergraduate Research 1, Optimization of Surface Preparation and Surface Passivation for GaSb Infrared Photodetectors G. Hearn University of South Carolina, Columbia, SC 29208

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Source URL: jur.phy.uic.edu

Language: English - Date: 2008-02-04 13:20:15
127Electronic engineering / Electronics manufacturing / Light-emitting diode / Signage / Integrated circuits / Printed circuit board / Semiconductor device fabrication / Three-dimensional integrated circuit / Dynamic random-access memory / Gallium nitride / Silicon carbide

Stretchable Electronics: Stretchable InorganicSemiconductor Electronic Systems (Adv. Mater)

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Source URL: rogers.matse.illinois.edu

Language: English - Date: 2011-07-08 11:04:37
128Ceramic materials / Semiconductor device fabrication / Phosphates / Surface science / Phosphoric acid / Silicon / Dissolution / Porous silicon / Hydroxide / X-ray photoelectron spectroscopy / Etching

SILICON NANOMEMBRANES The ability of silicon to dissolve in physiological environments allows its use as the basis of a highperformance inorganic integrated circuit technology for active, bioresorbable implant devices. N

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Source URL: rogers.matse.illinois.edu

Language: English - Date: 2015-03-16 11:38:51
129Packaging / Electronics manufacturing / Semiconductor device fabrication / Solder ball / Rework / Flip chip / Solder / Chip-scale package / Reliability / Automated X-ray inspection / Integrated circuit packaging / Flux

Production Test Chip-scale packages: Inspection methods for diverse designs

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Source URL: www.sonoscan.com

Language: English - Date: 2016-07-20 11:09:32
130Semiconductor device fabrication / Electronic engineering / Design for X / Electronic design automation / Coupon / Reliability / Integrated circuit design / Fabless manufacturing / Device under test / Electromigration

Rapid Characterization Method for New Semiconductor Processes Esko Mikkola, Ph.D., & Andrew Levy Ridgetop Group IncWest Ina Road Tucson, AZUSA

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Source URL: www.ridgetopgroup.com

Language: English - Date: 2015-07-18 01:30:09
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